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技术文档 文档类型 发布日期 Testing High Power Semiconductor Devices from Inception to Market
Introduction This primer examines the life cycle of a power semiconductor device and the tremendous variety of test and characterization activities and measurement challenges faced by the engineers involved in each stage …入门手册 9139B Probe Card Adapter Board Files
This zip file contains files for fabrication of a 9139B-PCA (Probe Card Adapter) probe card. Files include a fabrication print and Gerber files.技术数据 High Voltage 1 kV Capacitance-Voltage Measurements with the Keithley S530-HV Parametric Test System
Due to the complexities typically associated with high voltage (1 kV) capacitance wafer-level testing, 1 kV C-V testing is usually limited to characterization labs or manual benchtop setups that are separate from a fab’s standard production workflow …应用指南 Making Microsecond Pulse and AC Measurements with the S530 Parametric Test System by Integrating 4200A-SCS Parameter Analyzer Applications
This application note describes how to generate microsecond pulsed I-V sweeps and tests, as well as make AC impedance measurements, with the S530 Parametric Test System by calling built-in user libraries from the 4200A-SCS Parameter Analyzer in the …应用指南 Protecting Parametric Test Systems and the Test Environment from Damaging Transient Overvoltages and Overcurrents
Measuring breakdown parameters is increasingly required to predict a device’s safe region of operation. Sometimes, those breakdown conditions in reliability testing and breakdown test occur as a result of unexpected behaviors, such as a second …应用指南 Programming and Erasing Flash Memory Devices Using the Keithley S530 Pulse Generator Option
This note provides an overview of how to use the S530 Parametric Test System’s pulse source option to program and erase NAND flash memory cells. For further information on these measurements and on the S530 Parametric Test System pulse option …应用指南 Performing van der Pauw Sheet Resistance Measurements Using the Keithley S530 Parametric Tester
Accurate low voltage measurements are essential to many semiconductor tests. Often, test structures such as contact chains, vias, and metal structures have resistances on the order of tens to hundreds of milliohms. Measuring such small resistances …应用指南
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软件 文档类型 部件号： 发布日期 Matlab_Hello world使用Matlab对仪器设备进行编程入门
本例程提供了Matlab对仪器进行控制，演示了最基本的连接仪器的步骤。 请注意相关软件配置环境以及VISA resource地址。Tektronix公司不负责该例程的完整性、可执行性和正确性。 请点击‘’安装说明“链接直接获取 TXT 源码文件脚本例程